Non - Destructive Testing
Optical
CSAM
FTIR/TGA
SEM/EDX
XRF
Destructive Testing
Wire Pull
Bond Shear
BGA Pull
Die Shear
Cross-Sectional Analysis
Decap
Electrical Testing
Automated Test Equipment (ATE)
Bench Top
PWS Analog (I/V)
ATV Digital
Memory/ASIC/Micro
Transistors/OpAmps
Manufacturing Defects Analysis
Flying Probe Test
In-Circuit Test
Automatic Optical Inspection (AOI)
2D X-Ray
3D X-Ray (AXI-CT)
Destructive Physical Analysis
Functional Testing:
Digital
Analog
Radio Frequency (RF)
Safety Testing
JTAG Compliant Devices
In-Circuit Emulators (ICE)
BDI
Reliability Testing:
Environmental Stress Screening (ESS)
Burn-in
Temperature Cycling
HASS
Vibration
HAST
Humidity
Leak Testing
Thermal Shock
Hardware Tests:
Bed of Nails
Mechanical and Electrical Interfaces
Circuit Card Assemblies and Cable Assemblies
Data Acquisition Equipment
Product Serialization and Tracking
Environmental Stress Screening
Software Tests:
Live Access to Test Data
Functional Testing with Full Data Collection
Automated Test Reporting within Shop Floor Control
Data Analytics for Product Performance Monitoring
Automated Graphical User Interfaces
